Quotation Keijl, Steffen, Gilsing, Victor, Knoben, Joris, Duysters, Geert. 2012. The trap in between local and distant recombination: The degree of recombination and technological impact of inventions explored. Academy of Management Conference, Boston, MA, Vereinigte Staaten/USA, 03.08-07.08.


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Publication's profile

Status of publication Published
Affiliation WU
Type of publication Paper presented at an academic conference or symposium
Language English
Title The trap in between local and distant recombination: The degree of recombination and technological impact of inventions explored
Event Academy of Management Conference
Year 2012
Date 03.08-07.08
Country United States/USA
Location Boston, MA

Associations

People
Keijl, Steffen (Former researcher)
External
Duysters, Geert (Tilburg University, Netherlands)
Gilsing, Victor (University of Antwerp, Belgium)
Knoben, Joris (Radboud University Nijmegen, Netherlands)
Organization
Institute for Strategy, Technology and Organization IN (Details)
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